In this work an X band Build In Test Equipment (BITE), implemented in the SiGe BiCMOS technology of Infineon, is presented. The possibility to perform precise measurements of phase shift and gain in the X- band, using lower frequency ( 4GHz-6GHz) automated test equipment (ATE), which is also used in WLAN devices, is investigated, leading to the design of the complete test equipment and finally to the full custom layout design
Design of a Built-In Test Equipment for a X-band phased array radar system in SiGe BiCMOS technology
Calabrò, Rocco
2014/2015
Abstract
In this work an X band Build In Test Equipment (BITE), implemented in the SiGe BiCMOS technology of Infineon, is presented. The possibility to perform precise measurements of phase shift and gain in the X- band, using lower frequency ( 4GHz-6GHz) automated test equipment (ATE), which is also used in WLAN devices, is investigated, leading to the design of the complete test equipment and finally to the full custom layout designFile in questo prodotto:
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Utilizza questo identificativo per citare o creare un link a questo documento:
https://hdl.handle.net/20.500.12608/18279