This thesis work retgards the reliability study of InAs quantum dot lasers for silicon photonics. This work was done in collaboration with the University of California, Santa Barbara (UCSB). Several accelerated stress test was performed on the devices, in order to investigate the degradation mechanisms.
Impact of growth substrate on the reliability of InAs Quantum Dot Lasers for Silicon Photonics
Rovere, Lorenzo
2019/2020
Abstract
This thesis work retgards the reliability study of InAs quantum dot lasers for silicon photonics. This work was done in collaboration with the University of California, Santa Barbara (UCSB). Several accelerated stress test was performed on the devices, in order to investigate the degradation mechanisms.File in questo prodotto:
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lorenzo_rovere_tesi.pdf
Open Access dal 10/07/2022
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Utilizza questo identificativo per citare o creare un link a questo documento:
https://hdl.handle.net/20.500.12608/28951