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Analysis and Modelling of Semi-Vertical GaN devices
2021/2022 CAVALIERE, ALBERTO
Analysis of the degradation mechanism in MQW UV-C LEDs and advanced defect spectroscopy
2023/2024 SARTORI, DAVIDE
Gate Reliability of enhanced-mode p-GaN HEMTs
2022/2023 DISARÒ, MICHELE
OFF-state drain reliability of enhanced mode AlGaN/GaN power HEMTs: TDDB and avalanche processes
2023/2024 DELL'ANDREA, MATTEO
Tipologia | Anno | Titolo | Titolo inglese | Autore | File |
---|---|---|---|---|---|
Lauree magistrali | 2021 | Analysis and Modelling of Semi-Vertical GaN devices | Analysis and Modelling of Semi-Vertical GaN devices | CAVALIERE, ALBERTO | |
Lauree magistrali | 2023 | Analysis of the degradation mechanism in MQW UV-C LEDs and advanced defect spectroscopy | Analysis of the degradation mechanism in MQW UV-C LEDs and advanced defect spectroscopy | SARTORI, DAVIDE | |
Lauree magistrali | 2022 | Gate Reliability of enhanced-mode p-GaN HEMTs | Gate Reliability of enhanced-mode p-GaN HEMTs | DISARÒ, MICHELE | |
Lauree magistrali | 2023 | OFF-state drain reliability of enhanced mode AlGaN/GaN power HEMTs: TDDB and avalanche processes | OFF-state drain reliability of enhanced mode AlGaN/GaN power HEMTs: TDDB and avalanche processes | DELL'ANDREA, MATTEO |
Mostrati risultati da 1 a 4 di 4
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