Copper is widely known as a metal with very good physical and electrical characteristics. The main disadvantage that has strongly limited its use for the deposition of the metal contact in silicon solar cells is its high diffusivity in the silicon bulks. The purpose of this thesis is to study this phenomenon of light-induced degradation and investigate the effectiveness of a method consisting of the deposition of a certain amount of negative charge on both sides of the sample

Reduction of light-induced degradation caused by copper contamination in silicon solar cells

Inglese, Alessandro
2013/2014

Abstract

Copper is widely known as a metal with very good physical and electrical characteristics. The main disadvantage that has strongly limited its use for the deposition of the metal contact in silicon solar cells is its high diffusivity in the silicon bulks. The purpose of this thesis is to study this phenomenon of light-induced degradation and investigate the effectiveness of a method consisting of the deposition of a certain amount of negative charge on both sides of the sample
2013-04-22
silicon solar cells, copper contamination, LID, lifetime measurement, aluminum-oxide passivation, boron-oxygen complexes, Herguth method
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.12608/16597