Since the signal to be measured contains high-frequency components, the quality of the measurement at specific frequencies (from 10k to 10M Hz) is to be assessed. To achieve this, two measuring devices are employed: A 50-ohm resistor, a cable with the same characteristic impedance, and an oscilloscope with an equal resistance. A 100-ohm resistor, a cable with the same characteristic impedance, and an oscilloscope with a 1 MOhm resistance, along with a parallel 100-ohm resistor to match the impedance of the measurement instrument with the other two components.
Dato che il segnale da misurare presenta componenti in alta frequenza, si vuole valutare la bontà della misurazione a specifiche frequenze date (da 10k a 10M Hz). Per fare ciò si ricorre a due apparati di misurazione: -Resistore da 50 Ohm, cavo con impedenza caratteristica dello stesso valore e oscilloscopio con resistenza uguale. - Resistore da 100 Ohm, cavo con impedenza caratteristica dello stesso valore e oscilloscopio con resistenza da 1 MOhm, con in parallelo un resistore da 100 Ohm in modo che l’impedenza dello strumento di misurazione sia uguale a quella delle altre due componenti.
Analisi circuitali per lo sviluppo di sistemi di misura delle microscariche nell’esperimento High Voltage Padova Test Facility
FRASSON, EMANUELE
2023/2024
Abstract
Since the signal to be measured contains high-frequency components, the quality of the measurement at specific frequencies (from 10k to 10M Hz) is to be assessed. To achieve this, two measuring devices are employed: A 50-ohm resistor, a cable with the same characteristic impedance, and an oscilloscope with an equal resistance. A 100-ohm resistor, a cable with the same characteristic impedance, and an oscilloscope with a 1 MOhm resistance, along with a parallel 100-ohm resistor to match the impedance of the measurement instrument with the other two components.File | Dimensione | Formato | |
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https://hdl.handle.net/20.500.12608/63035