Enhanced calorimetric setup for precise evaluation of power devices' switching losses

The rapid increase of electronic components based on wide band-gap semiconductors imposes an accurate study of the losses, in particular during the switching phase. The widely spread method of Double Pulse Test (DPT) is no longer reliable for this kind of application, therefore various calorimetric methods have been developing among scientific community, but an accurate separation between the conduction losses and the switching ones is still a challenging task. In this thesis, a review of the state of the art regarding the losses estimation will be done, by analyzing strengths and weaknesses of the proposed methods in literature. After that, starting from an already existing setup available at Power Electronics Laboratory of University of Padova, some improvement will be developed in order to extend its range of dissipable power. Finally, after the description, integration and the test of the improvements, a PCB for the test of SiC devices without Kelvin source will be designed.